A comprehensive range of materials characterisation
techniques are available at the NCLA. These techniques are divided into categories
as outlined below..
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Surface Analysis |
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Measurement of: Surface roughness,
topography, critical dimensions, film thickness, step height.
More detail. |
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Spectroscopy |
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Raman and
photoluminescent spectroscopy on a wide range of solids, liquids and gases. Wavelength
range from 355 nm to >1000 nm.
More detail. |
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| Thin Film Measurement |
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Thickness and optical property (n & k
values) determination for thin films.
More detail. |
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